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DIRECT ELECTRON-BEAM WRITING WITH HIGH ASPECT RATIO FOR FABRICATING ION-BEAM LITHOGRAPHY MASK |
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Byoung-Nam Lee, Yong-Hoon Cho, Young-Seok Kim, Wan Hong, and Hyung-joo Woo [Proceedings of 2002 International Conference on Semiconductor] |
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Ion Beam Lithography Using Membrane Masks |
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Young Suk Kim, Wan Hong, Hyung Joo Woo, Han Woo Choi, Gi Dong Kim, Jin Ho Lee and Samkeun Lee [Jap. J. Appl. Phys., 41(2002)4141] |
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Optimisation of microlenses fabricated by deep proton irradiation and styrene diffusion |
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H.-J. Woo, Y.-S. Kim, H.-W. Choi, W. Hong, S Lee, M. Kufner, S. Kufner [Microelectronic Engineering, 57-58(2001)945] |
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Characteristic Analysis for a TiT Target Using Nuclear Reactions |
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G.D. Kim, T.K. Yang, J.K. Kim, Y.S. Kim, W. Hong, H.W. Choi, H.J. Woo, and J.H. Chang [J. Kor. Phys. Soc., 38(2001)299] |
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OPTICAL PROPERTY MODIFICATION OF PMMA BY ION-BEAM IMPLANTATION |
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Wan Hong, Hyung-Joo Woo, Han-Woo Choi and Young-Suk Kim [Appl. Surface Sci., 169-170(2001)428] |
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Structural modification of poly(methyl methacrylate) by proton irradiation |
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H. W. Choi, H. J. Woo,W. Hong, J. K. Kim, S. K. Lee and C. H. Eum [Appl. Surface Sci., 169-170(2001)433] |
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Stimulated emission at 326 nm and an ultrafast 100-ps-lived luminescence component by ion irradiation of a-alumina |
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Kazuie Kimura, Junichi Kaneko, Sumit Sharma, Wan Hong, Noriaki Itoh [Phys. Rev. B, 60(1999)12626] |
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A wavelength dispersive X-ray spectrometer for small area X-ray fluorescence spectroscopy at SPring-8 BL39XU |
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Shinjiro Hayakawa, Akihisa Yamaguchi, Wan Hong, Yohichi Gohshi, Tokujiro Yamamoto, Kouichi Hayashi, Jun Kawai, Shunji Goto [Spectrochim. Acta, B54(1999)171] |
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Light Element Analysis in Steel by High-Energy Heavy-Ion TOF-ERDA (Elastic Recoil Detection Analysis) |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Yohichi Gohshi [Spectrochim. Acta, B54(1999)151] |
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Decay enhancement of self-trapped excitons at high density and low temperature in an ion-irradiated BaF2 single crystal |
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Kazuie Kimura, Wan Hong [Phys. Rev. B, 58(1998)6081] |
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Extremely fast decay component of UV luminescence from 2-MeV/amu ion irradiated alumina |
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Kazuie Kimura, Wan Hong, Junichi Kaneko, Noriaki Itoh [NIM, B141(1998)425] |
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Improvement in the detection limits of ERDA Using a Time-of-Flight Detection |
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W.Hong, S.Hayakawa, K.Maeda, S.Fukuda, K.Kimura, Y.Gohshi, I.Tanihata [RIKEN Accel. Prog. Rep. 1997, 31(1998)177] |
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Determination of the mass and depth resolution of TOF-ERDA |
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W.Hong, S.Hayakawa, K.Maeda, S.Fukuda, K.Kimura, Y.Gohshi, I.Tanihata [RIKEN Accel. Prog. Rep. 1997, 31(1998)178] |
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A 100 ps lived new luminescence component in ion irradiated alumina |
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K.Kimura, W.Hong, J. Kaneko and N. Itoh [RIKEN Accel. Prog. Rep. 1997, 31(1998)152] |
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Development of a High Mass-Resolution TOF-ERDA System for a Wide Mass Range from Hydrogen to Middle Heavy Elements |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [Anal. Sci., 13(1997)365] |
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Improvement in the Detection Limits of Elastic Recoil Detection Analysis (ERDA) Using a Time-of-Flight Detection |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [Jpn. J. Appl. phys., 36(1997)L952] |
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Determination of the Mass Resolution and the Depth Resolution of Time of Flight Elastic Recoil Detection Analysis Using Heavy Ion Beams |
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Wan Hong , Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [Jpn. J. Appl. phys., 36(1997)5737] |
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Development of a High Mass-Resolution TOF-ERDA System for a Wide Mass Range |
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W.Hong, S.Hayakawa, K.Maeda, S.Fukuda, M.Yanokura, M.Aratani, K.Kimura, Y.Gohshi, I.Tanihata [NIM B124(1997)95] |
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Development of TOF-ERDA system for a wide mass range |
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W.Hong, S.Hayakawa, K.Maeda, S.Fukuda, M.Yanokura, M.Aratani, K.Kimura, Y.Gohshi, I.Tanihata [RIKEN Accel. Prog. Rep. 1996, 30(1997)162] |
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Decay Enhancement of Self-Trapped Excitons at High Excitation-Density and Low Temperature in an Ion-Irradiatioed BaF2 Single Crystal |
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K.Kimura, T.Kohama, D.Kawakami and W.Hong [RIKEN Accel. Prog. Rep. 1996, 30(1997)129] |
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DIRECT ELECTRON-BEAM WRITING WITH HIGH ASPECT RATIO FOR FABRICATING ION-BEAM LITHOGRAPHY MASK |
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Byoung-Nam Lee, Yong-Hoon Cho, Young-Seok Kim, Wan Hong, and Hyung-joo Woo [2002 International Conference on Semiconductor, Aug. 2002, Jeju, Korea] |
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The Nanosecond Bunching System at KIGAM Tandem |
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G.D.Kim, W. Hong, H. W. Choi, H. J. Woo, J.K. Kim and J.H. Chang [2002 Workshop on Nuclear data Production and Evaluation, Aug. 29. 2002, Pohang, Korea] |
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Thin Film Analysis by Ion Beam Techniques |
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Wan Hong, Gi Dong Kim, Hyung Joo Woo, Han Woo Choi and Joon Kon Kim [15th Conference of Tandem Accelerators and Related Techniques, June 2002, Tsuruga, Japan] |
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A MeV Neutron Bunching System in KIGAM Tandem Accelerator |
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Gi Dong Kim, Wan Hong, Hyung Joo Woo, Han Woo Choi and Jong Hwa Chang [15th Conference of Tandem Accelerators and Related Techniques, June 2002, Tsuruga, Japan] |
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Fabrication and characterization of channeling mask for ion beam lithography-- Korean |
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Y.S. Kim, W. Hong, J.H. Lee, H.J. Woo, H.W. Choi, G.D. Kim [2002 Spring Conf. of Kor. Phys. Soc. in Apr. 2002, BEXCO, Pusan, Korea] |
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Setup of e-beam writing system and optimization of developping condition for fabrication of ion beam mask-- Korean |
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B.N. Lee, Y.H. Cho, W. Hong, Y.S. Kim, C.K. Hwang, H.K. Park [2002 Spring Conf. of Kor. Phys. Soc. in Apr. 2002, BEXCO, Pusan, Korea] |
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Simulation And Parameter Calculation Of Bunching System For Tandem Accelerator-- Korean |
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W.Hong, G.D. Kim, Y.S Kim, H.J.Woo, H.W. Choi, and J.H. Chang [2002 Spring Conf. of Kor. Phys. Soc. in Apr. 2002, BEXCO, Pusan, Korea] |
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Design of MeV neutron pulsing and bunching system in KIGAM-- Korean |
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G.D. Kim, W.Hong, Y.S Kim, H.J.Woo, H.W. Choi, and J.H. Chang [2002 Spring Conf. of Kor. Phys. Soc. in Apr. 2002, BEXCO, Pusan, Korea] |
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Ion Beam Lithography using Membrane Masks |
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Y.S Kim, W.Hong, H.J.Woo, H.W. Choi, G.D. Kim and S. Lee [Micro & Nano Conference 2001, 10. 30 - 11. 2, Shimane Matsui, Japan] |
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On-line Radiographic Thickness Measurement System of Insulated Pipelines |
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G.D. Kim, W. Hong, Y.S. Kim, H.W. Choi, H.J. Woo, T.G. Yang, J.H. Lee, K.S. Cho, J.H. Jang [Kor. Phys. Society Conf. in Fall, Oct 19-20 2001 Chunam Nat. Univ., Kwangjoo] |
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°í¿¡³ÊÁö À̿ºöÀÇ ³ª³ë±â¼ú¿¡ÀÇ È°¿ë-- Korean |
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¿ìÇüÁÖ, ±è¿µ¼®, ÃÖÇÑ¿ì, È«¿Ï, ±è±âµ¿ [Çѱ¹¹°¸®ÇÐȸ 2001³âµµ Ãß°èÇмú´ëȸ, 10. 19-20, Àü³²´ëÇб³, ±¤ÁÖ] |
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Neutron Capture Cross Sections from 1 MeV to 2 MeV by Activation Measurements |
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G.D.Kim, T.K.Yang, Y.S.Kim, H.J.Woo, H.W.Choi, W. Hong and J.H.Chang [4rd workshop on nuclear data production and evaluation, 24-25, Aug. 2001, Pohang Univ., Pohang] |
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1-2MeV ±¸°£ÀÇ Áß¼ºÀÚ¿¡´ëÇÑ 63CuÀÇ Áß¼ºÀÚ Æ÷ȹ´Ü¸éÀû ÃøÁ¤-- Korean |
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±è±âµ¿,¾çŰÇ,±è¿µ¼®,È«¿Ï,ÃÖÇÑ¿ì,ÀÌÁøÈ£,¿ìÇüÁÖ [Çѱ¹¹°¸®ÇÐȸ 2001³âµµ Ãá°èÇмú´ëȸ, 4. 27, °æÈñ´ëÇб³, ¼¿ï] |
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Channeling ºÐ¼®¹ýÀ» ÀÌ¿ëÇÑ CaF2(Sm) ´Ü°áÁ¤ÀÇ ±¸Á¶Æ¯¼º ¿¬±¸-- Korean |
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J.H. Lee, Y.S. Kim, W. Hong, G.D. Kim [Çѱ¹ºÐ¼®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 11. 24-25, Á¦ÁÖ´ë, Á¦ÁÖ] |
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KIGAM Proton Microprobe System (I) -MQDÀÇ ¼³°è¿Í Ư¼ºÆò°¡¸¦ Áß½ÉÀ¸·Î-- Korean |
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J.K. Kim, H.J. Woo, W. Hong, N.B. Kim [Çѱ¹ºÐ¼®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 11. 24-25, Á¦ÁÖ´ë, Á¦ÁÖ] |
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Channeling ºÐ¼®¹ýÀ» ÀÌ¿ëÇÑ °áÁ¤±¸Á¶ ¹× °áÇÔ ºÐ¼®-- Korean |
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J.H. Lee, W. Hong, Y.S. Kim, J.K. Kim, G.D. Kim, H.W. Choi, H.J. Woo [Çѱ¹¹°¸®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 10. 27-28, Æ÷Ç×°ø´ë, Æ÷Ç×] |
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9 MeV °í¿¡³ÊÁö °¨¸¶¼±°ËÃâÀ» À§ÇÑ ¾î·¹À̰ËÃâ±â °³¹ß-- Korean |
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W. Hong, G.D. Kim, Y.S. Kim, J.H. Lee, T.K. Yang, J.K. Kim, H.W. Choi, H.J. Woo [Çѱ¹¹°¸®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 10. 27-28, Æ÷Ç×°ø´ë, Æ÷Ç×] |
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º¸¿ÂÀçÆÄÀÌÇÁ ¶óÀÎÀÇ µÎ²² ÃøÁ¤¿ë °¨¸¶¼± ¾î·¹ÀÌ °ËÃâ±â Á¦ÀÛ-- Korean |
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G.D. Kim, W. Hong, Y.S. Kim, T.K. Yang, K.S. Choi, J.H. Chang [Çѱ¹¹°¸®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 10. 27-28, Æ÷Ç×°ø´ë, Æ÷Ç×] |
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ÇÙ¹ÝÀÀÀ» ÀÌ¿ëÇÑ TiT Ç¥ÀûÀÇ Æ¯¼ººÐ¼®-- Korean |
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G.D. Kim, T.K. Yang, J.K. Kim, Y.S. Kim, W. Hong, H.W. Choi, H.J. Woo, J.H. Chang [Çѱ¹¹°¸®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 10. 27-28, Æ÷Ç×°ø´ë, Æ÷Ç×] |
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¼ö¹é keV ¾ç¼ºÀÚ¸¦ ÀÌ¿ëÇÑ À̿ºö ¸®¼Ò±×¶óÇÇÀÇ ºÐÇØ´É ÃøÁ¤-- Korean |
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Y.S. Kim, W. Hong, H.J. Woo, H.W. Choi [Çѱ¹¹°¸®ÇÐȸ 2000³âµµ Ãß°èÇмú´ëȸ, 10. 27-28, Æ÷Ç×°ø´ë, Æ÷Ç×] |
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Optimisation of microlenses fabricated by deep proton irradiation and styrene diffusion |
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HYUNG-JOO WOO, YOUNG-SUK KIM, HAN-WOO CHOI, WAN HONG, MARIA KUFNER, STEFAN KUFNER[Micro & Nano Engineering 2000, 17-21, Sep. Jena, German] |
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Measurement of Neutron Energy and Flux of KIGAM's Neutron Facility |
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G.D.Kim, T.K.Yang, J.K.KIM, Y.S.Kim, W.Hong, H.J.Woo, H.W.Choi and J.H.Chang[3rd workshop for nuclear data production and evaluation, 25, Aug. 2000, Pohang Univ., Pohang] |
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ä³Î¸µÀ» ÀÌ¿ëÇÑ Àΰø°áÁ¤ÀÇ °áÇÔÁ¤·®-- Korean |
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W. Hong, J.K. Kim, Y.S. Kim, G.D. Kim, H.J. Woo, H.W. Choi [Çѱ¹¹°¸®ÇÐȸ 2000³âµµ Ãá°èÇмú´ëȸ, 4. 28-29, À°±º»ç°üÇб³, ¼¿ï] |
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Study on fabricating burried-type waveguide in PMMA by ion implantation-- Korean |
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Wan Hong, Hyungjoo Woo, Hanwoo Choi, Junkon Kim, Gidong Kim, Youngsuk Kim [KPS 1999 Fall confenrece, Oct. 15-16, Pukyung Univ. Pusan] |
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Optical Property Modification of PMMA by Ion-Beam Implantation |
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Wan Hong, Hyung-Joo Woo, Han-Woo Choi and Young-Suk Kim [VASSCAA-1, 8-10th, Sep. 1999, Tokyo] |
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°í¿¡³ÊÁö ÁßÀ̿ TOF-ERDA ¸¦ ÀÌ¿ëÇÑ ¹Ú¸·ºÐ¼®-- Korean |
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È«¿Ï, ¿ìÇüÁÖ, ±è¿µ¼®, ±è±âµ¿, ±èÁذï, ÃÖÇÑ¿ì [Çѱ¹Áø°øÇÐȸ 1999³âµµ Çмú´ëȸ, 7. 3, Á¦ÁÖ´ëÇÐ, Á¦ÁÖ] |
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°í¿¡³ÊÁö À̿ºö¿¡ ÀÇÇÑ ÀÌÂ÷ÀüÀÚ ¹ß»ý¼öÀ² ¹× ¿¡³ÊÁö ÃøÁ¤ |
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±è±âµ¿, ±èÁذï, È«¿Ï, ÃÖÇÑ¿ì, ±è¿µ¼®, ¿ìÇüÁÖ [Çѱ¹Áø°øÇÐȸ 1999³âµµ Çмú´ëȸ, 7. 3, Á¦ÁÖ´ëÇÐ, Á¦ÁÖ] |
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 |
ä³Î¸µºÐ¼®À» À§ÇÑ ½Ã·á ¹æÇâÁ¦¾îÀåÄ¡ ¼³Ä¡ ¹× °³ÀοëÄÄÇ»Å͸¦ ÀÌ¿ëÇÑ Á¦¾îÇÁ·Î±×·¥ÀÇ °³¹ß-- Korean |
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È«¿Ï, ±è¿µ¼®, ±èÁذï, ±è±âµ¿, ¿ìÇüÁÖ, ±è³«¹è [Á¦ 22ȸ Çѱ¹ºÐ¼®ÇÐȸ 1999³âµµ Ãá°èÇмú´ëȸ, 5. 14 ~ 15, °¸ª´ëÇÐ, °¸ª] |
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External PIXE ¸¦ ÀÌ¿ëÇÑ ºÒ»óÀÇ ¼ººÐ ºÐ¼®-- Korean |
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±è±âµ¿, ÃÖÇÑ¿ì, ±è¿µ¼®, ±èÁذï, È«¿Ï, ¿ìÇüÁÖ [Á¦ 22ȸ Çѱ¹ºÐ¼®ÇÐȸ 1999³âµµ Ãá°èÇмú´ëȸ, 5. 14 ~ 15, °¸ª´ëÇÐ, °¸ª] |
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À̿ºö¿¡ ÀÇÇÑ ÀÌÂ÷ÀüÀÚÀÇ ¹ß»ý¼öÀ² ¹× ¿¡³ÊÁö ÃøÁ¤-- Korean |
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±è±âµ¿, ±è¿µ¼®, È«¿Ï, ±èÁذï, ÃÖÇÑ¿ì, ¿ìÇüÁÖ [Çѱ¹¹°¸®ÇÐȸ 1999³âµµ Ãá°èÇмú´ëȸ, 4. 25, °Ç±¹´ëÇб³, ¼¿ï] |
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 |
°í¿¡³ÊÁö ¾ç¼ºÀÚºö¿¡ ÀÇÇÑ Au, Al ·Î ºÎÅÍ ¹æÃâµÈ ÀÌÂ÷ÀüÀÚ ÃøÁ¤-- Korean |
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±è±âµ¿, ±è¿µ¼®, È«¿Ï[Çѱ¹¹°¸®ÇÐȸ 1998³âµµ Ãß°èÇмú´ëȸ, 10. 23 ~ 24, ÀüºÏ´ëÇб³, ÀüÁÖ] |
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 |
´ë±âºÐÁø(PM-10)ÀÇ ½ÇÇè½Ç°£ µ¿½Ã ÃøÁ¤ ¿¬±¸ |
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¼¿µÈ, À̺´±Ô, Á¤¿ë»ï, Á¤¿ëÁÖ, ¹®Á¾È, À̱æ¿ë, ½É»ó±Ç, È«¿Ï, ÃÖÇÑ¿ì [Çѱ¹´ë±âȯ°æÇÐȸ 1998³âµµ Ãß°èÇмú´ëȸ, 11. 13 ~ 14, ¿µ³²´ëÇб³, °æ»ê] |
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ÁßÀ̿ºö¿¡ ÀÇÇÑ ÀÌÂ÷ÀüÀÚ ¹ß»ý¿¡ °üÇÑ ¿¬±¸-- Korean |
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±è±âµ¿, ±èÁذï, ÃÖÇÑ¿ì, È«¿Ï, ±è¿µ¼®, ¿ìÇüÁÖ[Çѱ¹¹°¸®ÇÐȸ 1998³âµµ Ãá°èÇмú´ëȸ, 4. 24 ~ 25, °í·Á´ëÇб³, ¼¿ï] |
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Light-element measurements in a metallic material using heavy-ion TOF-ERDA |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [IBA-13 1997, Portugal, Lisbon] |
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Development of a High Mass-Resolution TOF-ERDA System for a Wide Mass Range from Hydrogen to Middle Heavy Elements |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [4th Asianalysis 1997, Fukuoka] |
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Determination of the Mass Resolution and Depth Resolution of Si by TOF-ERDA -- Japanese |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [Conf. of Japanese Appl. Phys. Soc. 1997, Spring, Chiba] |
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A Study on High Mass-Resolution Ion Beam Analysis by TOF-ERDA -- Japanese |
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Wan Hong, Shinjiro Hayakawa, Kuniko Maeda, Shigekazu Fukuda, Minoru Yanokura, Michi Aratani, Kazuie Kimura,Yohichi Gohshi, Isao Tanihata [Conf. of Japanese Appl. Phys. Soc. 1996, Spring, Saitama] |